IEC 60749-26-2006 半导体器件.机械和气候试验方法.第26部分:静电放电敏感性(ESD)试验.人体模型(HBM)
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【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Part26:Electrostaticdischarge(ESD)sensitivitytesting-Humanbodymodel(HBM)
【原文标准名称】:半导体器件.机械和气候试验方法.第26部分:静电放电敏感性(ESD)试验.人体模型(HBM)
【标准号】:IEC60749-26-2006
【标准状态】:现行
【国别】:国际
【发布日期】:2006-07
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:大气压;温度变化;分类;分类系统;气候;气候试验;组件;定义;尺寸;放电;电气元件;电气工程;电学测量;电子工程;电子设备及元件;静电的;静电放电;静电学;环境;环境试验;故障;易燃性;热学;人体;脉冲负载能力;集成电路;测量设备;机械试验;模型;潮气;耐力;半导体器件;半导体;模拟;温度;试验;试验装置;外观检查(试验)
【英文主题词】:Atmosphericpressure;Changesoftemperature;Checkingequipment;Classification;Classificationsystems;Climate;Climatictests;Components;Definitions;Dimensions;Discharge;Electricalcomponents;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Electrostatic;Electrostaticdischarges;Electrostatics;Environment;Environmentaltesting;Environmentaltests;Failure;Flammability;Heat;Humanbody;Impulseloadability;Integratedcircuits;Measuringequipment;Mechanicaltesting;Models;Moisture;Resistance;Semiconductordevices;Semiconductors;Simulation;Temperature;Testing;Testingdevices;Visualinspection(testing)
【摘要】:ThispartofIEC60749establishesastandardprocedurefortestingandclassifyingsemiconductordevicesaccordingtotheirsusceptibilitytodamageordegradationbyexposuretoadefinedhumanbodymodel(HBM)electrostaticdischarge(ESD).Theobjectiveistoprovidereliable,repeatableHBMESDtestresultssothataccurateclassificationscanbeperformed.Thistestmethodisapplicabletoallsemiconductordevicesandisclassifiedasdestructive.ESDtestingofsemiconductordevicesisselectedfromthistestmethod,themachinemodel(MM)testmethod(seeIEC60749-27)orotherESDtestmethodsintheIEC60749series.TheHBMandMMtestmethodsproducesimilarbutnotidenticalresults;unlessotherwisespecified,thistestmethodistheoneselected.NOTECertainclausesinthistestmethodareinaccordancewithIEC61340-3-1.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:27P.;A4
【正文语种】:英语
【原文标准名称】:半导体器件.机械和气候试验方法.第26部分:静电放电敏感性(ESD)试验.人体模型(HBM)
【标准号】:IEC60749-26-2006
【标准状态】:现行
【国别】:国际
【发布日期】:2006-07
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:大气压;温度变化;分类;分类系统;气候;气候试验;组件;定义;尺寸;放电;电气元件;电气工程;电学测量;电子工程;电子设备及元件;静电的;静电放电;静电学;环境;环境试验;故障;易燃性;热学;人体;脉冲负载能力;集成电路;测量设备;机械试验;模型;潮气;耐力;半导体器件;半导体;模拟;温度;试验;试验装置;外观检查(试验)
【英文主题词】:Atmosphericpressure;Changesoftemperature;Checkingequipment;Classification;Classificationsystems;Climate;Climatictests;Components;Definitions;Dimensions;Discharge;Electricalcomponents;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Electrostatic;Electrostaticdischarges;Electrostatics;Environment;Environmentaltesting;Environmentaltests;Failure;Flammability;Heat;Humanbody;Impulseloadability;Integratedcircuits;Measuringequipment;Mechanicaltesting;Models;Moisture;Resistance;Semiconductordevices;Semiconductors;Simulation;Temperature;Testing;Testingdevices;Visualinspection(testing)
【摘要】:ThispartofIEC60749establishesastandardprocedurefortestingandclassifyingsemiconductordevicesaccordingtotheirsusceptibilitytodamageordegradationbyexposuretoadefinedhumanbodymodel(HBM)electrostaticdischarge(ESD).Theobjectiveistoprovidereliable,repeatableHBMESDtestresultssothataccurateclassificationscanbeperformed.Thistestmethodisapplicabletoallsemiconductordevicesandisclassifiedasdestructive.ESDtestingofsemiconductordevicesisselectedfromthistestmethod,themachinemodel(MM)testmethod(seeIEC60749-27)orotherESDtestmethodsintheIEC60749series.TheHBMandMMtestmethodsproducesimilarbutnotidenticalresults;unlessotherwisespecified,thistestmethodistheoneselected.NOTECertainclausesinthistestmethodareinaccordancewithIEC61340-3-1.
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:27P.;A4
【正文语种】:英语
下载地址: 点击此处下载